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Automatic Detection of Chip Pin Defect in Semiconductor Assembly Using Vision Measurement

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  • Journal:Measurement Science Review

  • Co-author:Jian Zhang,Fei Hao,Liangbao Jiao

  • First Author:Shengfang Lu

  • Indexed by:Journal paper

  • Discipline:Engineering

  • Document Type:J

  • Volume:22

  • Issue:5

  • Page Number:231-240

  • Translation or Not:no

  • Date of Publication:2022-01-01

  • Included Journals:SCI

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